Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device.

An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.

ATE is widely used in the electronic manufacturing industry to test electronic components and systems after being fabricated. ATE is also used to test avionics and the electronic modules in automobiles. It is used in military applications like radar and wireless communication.

Semiconductor ATE, named for testing semiconductor devices, can test a wide range of electronic devices and systems, from simple components (resistors, capacitors, and inductors) to integrated circuits (ICs), printed circuit boards (PCBs), and complex, completely assembled electronic systems.

ATE systems are designed to reduce the amount of test time needed to verify that a particular device works or to quickly find its faults before the part has a chance to be used in a final consumer product.

To reduce manufacturing costs and improve yield, semiconductor devices should be tested after being fabricated to prevent defective devices ending up with the consumer.

Specifications for ATE Model T6682:

1. Chips in the tester itself are 0.35um technology.
2. 1024 independently controllable and observable channels.
3. Test speeds are 250MHz, 500MHz and 1GHz.
4. Overall timing accuracy is +/- 200ps.
5. Clock/strobe accuracy is +/- 870ps (80ps for AC measurements).
6. Drive voltages are -2.5 to 6V.
7. Pattern multiplexing (2 patterns written per ATE cycle) used for 500MHz.
8. Pin multiplexing (2 tester channels drive one chip pin) used for 1GHz.