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Enlist important electrical parameters for which measurement are required before device processing begins.

Also describe the experimental setup for the four probe method for resistivity measurement with the help of neat diagram.

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Electrical parameters:

  1. Characterization of starting wafer: P or N
  2. Resistivity: For measurement of hole and electron concentration
  3. Carrier mobility

Four Probe method:

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It is a common method to measure resistivity. In this method basically the current flowing for the unknown applied voltage is measured to calculate resistance or vice versa. …

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