- Recent developments have substantially improved the performance of DRIE with better sidewall protecting matrials.
- Silicon substracts with A/P over 100 was with θ = ±20 at a depth of up to 300 µm was achieved. The etching rate, however was reduced to 2-3 µm/min.
Popular sidewall protecting materials:
Sidewall protection materials |
Selectivity ratio |
Aspect ratio A/P |
Polymer |
|
30:1 |
Photoresists |
50:1 |
100:1 |
Silicon dioxide |
120:1 |
200:1 |
Wet Vs. Dry Etching
Parameters |
Dry etching |
Wet etching |
Directionality |
Good for most materials |
Only with single crystal materials (aspect ratio up to 100) |
Production-automation |
Good |
Poor |
Environmental impact |
Low |
High |
Masking film adherence |
Not as critical |
Very critical |
Selectivity |
Poor |
Very good |
Materials to be etched |
Only certain materials |
All |
Process scale up |
Difficult |
Easy |
Cleanliness |
Conditionally clean |
Good to very good |
Critical dimensional control |
Very good (< 0.1µm) |
Poor |
Equipment cost |
Expensive |
Less expensive |
Typical etch rate |
Slow (0.1 µm/min) to fast (6µm/min) |
Fast (1µm/min and up) |
Operational parameters |
Many |
Few |
Control of each rate |
Good in case of slow etch |
Difficult |