Explain metal migration in interconnect.

2views

written 3.0 years ago by

modified 23 months ago by

Metal migration or electro migration is the transport of metal ions through a conductor resulting from the passage of direct current. It is caused by a modification of the normally random diffusion process to a directional one caused by charge carriers. At high current densities, the aluminium atoms in a …

Create a free account to keep reading this post.

and 3 others joined a min ago.

ADD COMMENT EDIT